Intensity dependence of Z-scan in semiconductor-doped glasses for separation of third and fifth order contributions in the below band gap region
K. S. BindraLaser Physics Division, Centre for Advanced Technology, Indore 452013, IndiaS. M. OakLaser Physics Division, Centre for Advanced Technology, Indore 452013, IndiaK. C. RustagiLaser Physics Division, Centre for Advanced Technology, Indore 452013, India
1999en
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