K. S. Bindra

1 ta ish

Raja Ramanna Centre for Advanced Technology

1. Intensity dependence of Z-scan in semiconductor-doped glasses for separation of third and fifth order contributions in the below band gap region

   K. S. Bindra, S. M. Oak, K. C. Rustagi

   Maqola19993 iqtibos

   ABIABI:AkademIndex/2026.other.160873