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The Complexity of Testing Cryptographic Devices on Input Faults

Alisher IkramovNational University of Uzbekistan, Tashkent, UzbekistanGayrat JuraevNational University of Uzbekistan, Tashkent, Uzbekistan
Lecture notes in computer sciencebook series2021en

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VLSI and Analog Circuit TestingMathematical Control Systems and Analysis

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DOI
10.1007/978-3-030-92708-0_12

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