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VLSI and Analog Circuit Testing

21 ta ish

  1. The Complexity of Testing Cryptographic Devices on Input Faults

    Alisher Ikramov, Gayrat Juraev

    BobVLSI and Analog Circuit TestingLecture notes in computer science20215 iqtibos
    ABI

  2. Methods of Determining Reference Signals for One and Multichannel Signatural Analyzer of Microprocessor Systems

    Rustam Xusanovich Djuraev

    MaqolaOchiq kirishVLSI and Analog Circuit TestingCommunications20184 iqtibos
    ABI

  3. Development of simulation model of smart phase selector device

    E. Khojiakbar, I.Kh. Kholiddinov, Asrorbek Eraliev +2

    MaqolaOchiq kirishVLSI and Analog Circuit TestingE3S Web of Conferences20234 iqtibos
    ABI

  4. Model and Methods for Detecting Undetected Errors Using a Signature Analyzer

    Jo’shqin Baltayev, Sunnatillo Boltayev

    BobVLSI and Analog Circuit TestingLecture notes in networks and systems20222 iqtibos
    ABI

  5. Codebase release 5.3 for EDIpack

    Lorenzo Crippa, Igor Krivenko, Samuele Giuli +10

    MaqolaOchiq kirishEmbedded Systems Design TechniquesSciPost Physics Codebases20251 iqtibos
    ABI

  6. Study of the Method of Compact Testing of Technical Means of Data Transmission Networks

    Rustam Djurayev, Jo’shqin Baltayev, J.I. Badalov

    MaqolaVLSI and Analog Circuit Testing2020 International Conference on Information Science and Communications Technologies (ICISCT)20201 iqtibos
    ABI

  7. Fault tolerant and BIST design of a FIFO cell

    Fulvio Corno, P. Prinetto, M. Sonza Reorda

    MaqolaVLSI and Analog Circuit TestingPORTO Publications Open Repository TOrino (Politecnico di Torino)19960 iqtibos
    ABI

  8. An integrated HW and SW fault injection environment for real-time systems

    Alfredo Benso, Maurizio Rebaudengo, M. Sonza Reorda +1

    MaqolaRadiation Effects in Electronics20020 iqtibos
    ABI

  9. Design Validation of Multithreaded Processors Using Threads Evolution

    D. Ravotto, Ernesto Sánchez, M. Sonza Reorda +1

    MaqolaOchiq kirishEmbedded Systems Design TechniquesJournal of Integrated Circuits and Systems20100 iqtibos
    ABI

  10. A High Performance Digital Time Interval Spectrometer: An Embedded, FPGA-Based System With Reduced Dead Time Behaviour

    Mohammad Arkani

    MaqolaOchiq kirishAdvancements in PLL and VCO TechnologiesMetrology and Measurement Systems20150 iqtibos
    ABI

  11. History, Structure And Types Of Microprocessors

    Hakimov Zohid Abdullayevich

    MaqolaOchiq kirishEmbedded Systems Design TechniquesThe American Journal of Interdisciplinary Innovations and Research20200 iqtibos
    ABI

  12. test data for ParaQA

    Barshana Banerjee

    BoshqaOchiq kirishVLSI and Analog Circuit TestingFigshare20200 iqtibos
    ABI

  13. test data for ParaQA

    Barshana Banerjee

    BoshqaVLSI and Analog Circuit TestingFigshare20200 iqtibos
    ABI

  14. test data for ParaQA

    Barshana Banerjee

    BoshqaVLSI and Analog Circuit TestingFigshare20200 iqtibos
    ABI

  15. test data for ParaQA

    Barshana Banerjee

    BoshqaVLSI and Analog Circuit TestingFigshare20200 iqtibos
    ABI

  16. A Novel Compaction Approach for SBST Test Programs

    Juan-David Guerrero-Balaguera, Josie E. Rodriguez Condia, M. Sonza Reorda

    PreprintOchiq kirishVLSI and Analog Circuit Testing20210 iqtibos
    ABI

  17. Performance Analysis Of SRAM and Dram in Low Power Application

    S. Yuvaraj, D. Padmanaban, G. PraveenKumar +3

    MaqolaOchiq kirishLow-power high-performance VLSI designE3S Web of Conferences20230 iqtibos
    ABI

  18. A Versatile Strategy for Comprehensive Data Collection and Retention in Embedded SoC Memories

    Paolo Bernardi, Giorgio Insinga, M. Battilana +7

    MaqolaOchiq kirishVLSI and Analog Circuit TestingACM Transactions on Embedded Computing Systems20250 iqtibos
    ABI

  19. Analysis of Dynamic Domino Logic Gate Performance Using Body Bias Techniques in Sub-Micron VLSI

    Ravi Kumar M, K. M. Pimple, Prabhakaran K +3

    MaqolaLow-power high-performance VLSI design20250 iqtibos
    ABI

  20. AI-Driven Fault Detection and Predictive Maintenance in Green Electronic Systems

    Charul Jain, Bhupinder Kaur, Sumit Kumar +1

    MaqolaMachine Fault Diagnosis Techniques20260 iqtibos
    ABI

  21. VLM-Assisted Self-Healing GUI Testing with Hybrid CLIP SigLIP Matching

    Manzura Kosimova, Dilafruz Sayfullayeva, Bexzod Dehqonov +2

    BobVLSI and Analog Circuit TestingLecture notes in networks and systems20260 iqtibos
    ABI