J.I. Badalov

1 ta ish

Tashkent University of Information Technology

1. Study of the Method of Compact Testing of Technical Means of Data Transmission Networks

   Rustam Djurayev, Jo’shqin Baltayev, J.I. Badalov

   MaqolaVLSI and Analog Circuit Testing2020 International Conference on Information Science and Communications Technologies (ICISCT)20201 iqtibos

   ABIABI:AkademIndex/2026.other.621859