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Ish: Thermally Induced Deep Centers in Silicon Doped with Europium or Lanthanum

1. Comparison of Infrared and Activation Analysis Results in Determining the Oxygen and Carbon Content in Silicon

   C. Gross, Gianni Gaetano, T. N. Tucker +1

   Maqola19722 iqtibos

   ABIABI:AkademIndex/2026.other.387251

2. Sarlavhasiz

   Boshqa1 iqtibos

   ABIABI:AkademIndex/2026.other.387252