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7 ta ish

Ish: Cluster impacts at keV and MeV energies: Secondary emission phenomena

  1. Comparative study of polyatomic secondary ion emission from silicon with <mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" altimg="si11.gif" overflow="scroll"><mml:mrow><mml:msubsup><mml:mrow><mml:mtext>Au</mml:mtext></mml:mrow><mml:mrow><mml:mi>m</mml:mi></mml:mrow><mml:mrow><mml:mo>-</mml:mo></mml:mrow></mml:msubsup></mml:mrow></mml:math>, <mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" altimg="si12.gif" overflow="scroll"><mml:mrow><mml:msubsup><mml:mrow><mml:mtext>Si</mml:mtext></mml:mrow><mml:mrow><mml:mi>m</mml:mi></mml:mrow><mml:mrow><mml:mo>-</mml:mo></mml:mrow></mml:msubsup></mml:mrow></mml:math> and <mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" altimg="si13.gif" overflow="scroll"><mml:mrow><mml:msubsup><mml:mrow><mml:mtext>C</mml:mtext></mml:mrow><mml:mrow><mml:mi>m</mml:mi></mml:mrow><mml:mrow><mml:mo>-</mml:mo></mml:mrow></mml:msubsup></mml:mrow></mml:math> projectiles

    С. Н. Морозов, У. Х. Расулев

    MaqolaIon-surface interactions and analysisNuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms200611 iqtibos
    ABI

  2. On the Sputtering of Copper Phthalocyanine Molecules on a GaAs Substrate under Bombardment with Multiply Charged Ions

    Sh.Dj. Akhunov, У. Х. Расулев, Dilshadbek T. Usmanov

    MaqolaIon-surface interactions and analysisJournal of Surface Investigation X-ray Synchrotron and Neutron Techniques20213 iqtibos
    ABI

  3. Cluster projectile ions used for the SIMS analysis of silicon

    Sh.Dj. Akhunov, С. Н. Морозов

    MaqolaIon-surface interactions and analysisJournal of Surface Investigation X-ray Synchrotron and Neutron Techniques20132 iqtibos
    ABI

  4. Model for large cluster emission in ion sputtering of metals applied to atomic and polyatomic ion bombardments

    S.F. Belykh, V. I. Matveev, I. V. Veryovkin +2

    MaqolaOchiq kirishIon-surface interactions and analysisNuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms19992 iqtibos
    ABI

  5. A surface‐ionization method of detection of a neutral component of indium sputtering under bombardment by cluster ions

    С. Н. Морозов, У. Х. Расулев

    MaqolaIon-surface interactions and analysisSurface and Interface Analysis20121 iqtibos
    ABI

  6. Application of the surface ionization for the detection of secondary particles in the secondary-ion mass spectrometry (SIMS)

    С. Н. Морозов, У. Х. Расулев

    MaqolaIon-surface interactions and analysisTechnical Physics20130 iqtibos
    ABI

  7. Secondary Ion Emissions of Tm and Tb Targets Under Bombardment With Cluster Ions

    Guliston Kakhamonova, Sh.Dj. Akhunov, Makhmanazar M. Nazarov +2

    MaqolaIon-surface interactions and analysisSurface and Interface Analysis20240 iqtibos
    ABI