Effect of nonuniformities and the measurement current on the current-voltage characteristics of tunnel junctions

The observed deviations of the I–V characteristics of Al-Insulator-Al tunnel junctions from the theoretical form is shown to be due to the combined action of superconducting inhomogeneities in the films forming the junctions and the measurement current acting on the inhomogeneities. The magnitude of this effect is assumed to be related to the critical parameters (JK and HK) of the film material.

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