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2 ta ish

Ish: The effect of ultrasonic treatment on the generation characteristics of a Si-SiO2 interface

  1. The Pulsed MIS Capacitor. A Critical Review

    Jaehyeon Kang, D.K. Schroder

    Sharh maqola19857 iqtibos
    ABI
  2. Interpretation of surface and bulk effects using the pulsed MIS capacitor

    D.K. Schroder, J. Guldberg

    Maqola19712 iqtibos
    ABI