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30 ta ish

Ish: Application of RZ-scan technique for investigation of nonlinear refraction of sapphire doped with Ag, Cu, and Au nanoparticles

  1. Atomic force microscopy of Au implanted in sapphire

    D. O. Henderson, Ruojun Mu, Y. S. Tung +6

    Maqola19952 iqtibos
    ABI
  2. Sarlavhasiz

    Boshqa1 iqtibos
    ABI