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Ish: Single-shot reflection Z-scan for measurements of the nonlinear refraction of nontransparent materials
Sensitive measurement of optical nonlinearities using a single beam
Mansoor Sheik‐Bahae, A. A. Said, Tai‐Huei Wei +2
Maqola1990100 iqtibosABISensitivity-enhanced reflection Z-scan by oblique incidence of a polarized beam
M. Martinelli, S. Bian, J. R. Leite +1
Maqola19985 iqtibosABIMultiphoton absorption and nonlinear refraction of GaAs in the mid-infrared
W. C. Hurlbut, Yun-Shik Lee, K. L. Vodopyanov +2
Maqola20074 iqtibosABI