Energy resolution of silicon charged particle detectors
S. V. ArtemovInstitute of Nuclear Physics, Academy of Sciences of Uzbekistan, Ulugbek, Tashkent, 100214, UzbekistanG. A. RadyukInstitute of Nuclear Physics, Academy of Sciences of Uzbekistan, Ulugbek, Tashkent, 100214, UzbekistanА. А. КараходжаевInstitute of Nuclear Physics, Academy of Sciences of Uzbekistan, Ulugbek, Tashkent, 100214, UzbekistanYa. S. AbdullaevaInstitute of Nuclear Physics, Academy of Sciences of Uzbekistan, Ulugbek, Tashkent, 100214, UzbekistanV. P. YakushevInstitute of Nuclear Physics, Academy of Sciences of Uzbekistan, Ulugbek, Tashkent, 100214, Uzbekistan
ABI
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It is shown that the energy resolution of silicon detectors, estimated from α-ray spectra irradiated by a reference α source (i.e., the surface resolution), is not always an indicator of detector quality. The energy resolution found from the spectra of particles that penetrate deeply into the detector material (i.e., the depth resolution) can be quite inferior to the surface resolution. It is proposed that detectors be tested in a quasimochromatic neutron flux.
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