Excitation Energies of V n O+ m and Nb n O+ m Clusters Sputtered under Ion Bombardment
Н. Х. ДжемилевInstitute of Ion-Plasma and Laser Technologies, Academy of Sciences of the Republic of Uzbekistan, Tashkent, 100125, UzbekistanС. Ф. КоваленкоInstitute of Ion-Plasma and Laser Technologies, Academy of Sciences of the Republic of Uzbekistan, Tashkent, 100125, UzbekistanС. Е. МаксимовInstitute of Ion-Plasma and Laser Technologies, Academy of Sciences of the Republic of Uzbekistan, Tashkent, 100125, UzbekistanО. Ф. ТукфатуллинInstitute of Ion-Plasma and Laser Technologies, Academy of Sciences of the Republic of Uzbekistan, Tashkent, 100125, UzbekistanSh. T. KhojievInstitute of Ion-Plasma and Laser Technologies, Academy of Sciences of the Republic of Uzbekistan, Tashkent, 100125, Uzbekistan
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The decay of V n O + and Nb n O + clusters sputtered under bombardment of the surfaces of vanadium and niobium with Xe+ ions and oxygen inflow is investigated by secondary-ion mass spectrometry. Based on experimental data, the excitation energy is calculated within the framework of the theory of unimolecular reactions. It is demonstrated that the numerical values of the specific excitation energy of V n O + and Nb n O + within the accuracy of the procedure do not depend significantly on the number of atoms that make up the clusters, nor on their type.
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