Asosiy kontentga oʻtish
AkademIndex

Mahsulotlar

Ishlab chiquvchilar uchun

AkademBaseEkotizim uchun ochiq API
← Ishga qaytish

Ushbu ishga iqtibos qilgan ishlar

2 ta ish

Ish: Electronic properties of ionizing radiation-induced defects at SiO$_2$/Si interface associated with non-trivial excess current splitting