Ushbu ishga iqtibos qilgan ishlar

2 ta ish

Ish: Reflection z‐scan measurements of opaque semiconductor thin films

1. Application of RZ-scan technique for investigation of nonlinear refraction of sapphire doped with Ag, Cu, and Au nanoparticles

   R. A. Ganeev, A.I. Ryasnyansky, А. Л. Степанов +3

   MaqolaNonlinear Optical Materials StudiesOptics Communications20058 iqtibos

   ABIABI:AkademIndex/openalex/2005.article.000024

2. Single-shot reflection Z-scan for measurements of the nonlinear refraction of nontransparent materials

   R. A. Ganeev

   MaqolaNonlinear Optical Materials StudiesApplied Physics B20082 iqtibos

   ABIABI:AkademIndex/openalex/2008.article.000067