Ushbu ish iqtibos qilgan ishlar

9 ta ish

Ish: Interaction of deep impurities with radiation defects in n-Si at γ-irradiation

1. Deep-level transient spectroscopy: A new method to characterize traps in semiconductors

   D. V. Lang

   Maqola19749 iqtibos

   ABIABI:AkademIndex/openalex/2026.other.424573

2. The radiation-induced defects production in P-type silicon doped by impurities of transitional elements

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3. Electrical properties and recombination activity of copper, nickel and cobalt in silicon

   A. A. Istratov, E. R. Weber

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4. Properties of gold in silicon

   W Murray Bullis

   Maqola19663 iqtibos

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5. Deep levels in semiconductors

   M. Jaroš

   Maqola19802 iqtibos

   ABIABI:AkademIndex/openalex/2026.other.415236

6. Mechanism of Gold Diffusion into Silicon

   William R. Wilcox, T. J. LaChapelle

   Maqola19642 iqtibos

   ABIABI:AkademIndex/openalex/2026.other.610641

7. Sarlavhasiz

   Boshqa1 iqtibos

   ABIABI:AkademIndex/openalex/2026.other.610642

8. Sarlavhasiz

   Boshqa1 iqtibos

   ABIABI:AkademIndex/openalex/2026.other.610643

9. Sarlavhasiz

   Boshqa1 iqtibos

   ABIABI:AkademIndex/openalex/2026.other.610645