Ushbu ish iqtibos qilgan ishlar

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Ish: A Study of Defects in Heat Treated Cz-Silicon by Positron Annihilation

1. Positron Sudies of Thermal-Induced Defects in Silicon

   N.Yu. Arutyunov, V.Yu. Traschakov

   Maqola19892 iqtibos

   ABIABI:AkademIndex/openalex/2026.other.360579

2. Sarlavhasiz

   Boshqa1 iqtibos

   ABIABI:AkademIndex/openalex/2026.other.615809

3. Sarlavhasiz

   Boshqa1 iqtibos

   ABIABI:AkademIndex/openalex/2026.other.615810

4. Sarlavhasiz

   Boshqa1 iqtibos

   ABIABI:AkademIndex/openalex/2026.other.615811