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Lateral MoS<sub>2</sub> p–n Junction Formed by Chemical Doping for Use in High-Performance Optoelectronics

Min Sup ChoiSKKU Advanced Institute of Nano-Technology (SAINT), ‡Center for Human Interface Nano Technology (HINT), and §Samsung-SKKU Graphene Center (SSGC), Sungkyunkwan University , 2066, Seobu-ro, Jangan-gu, Suwon, Gyeonggi-do 440-746, Korea Deshun QuDaeyeong LeeXiaochi LiuKenji WatanabeNational Institute for Materials Science, 1-1 Namiki, Tsukuba, Ibaraki 305-0044, JapanTakashi TaniguchiNational Institute for Materials Science, 1-1 Namiki, Tsukuba, Ibaraki 305-0044, JapanWon Jong Yoo
2014en
ABI

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This paper demonstrates a technique to form a lateral homogeneous 2D MoS2 p-n junction by partially stacking 2D h-BN as a mask to p-dope MoS2. The fabricated lateral MoS2 p-n junction with asymmetric electrodes of Pd and Cr/Au displayed a highly efficient photoresponse (maximum external quantum efficiency of ∼7000%, specific detectivity of ∼5 × 10(10) Jones, and light switching ratio of ∼10(3)) and ideal rectifying behavior. The enhanced photoresponse and generation of open-circuit voltage (VOC) and short-circuit current (ISC) were understood to originate from the formation of a p-n junction after chemical doping. Due to the high photoresponse at low VD and VG attributed to its built-in potential, our MoS2 p-n diode made progress toward the realization of low-power operating photodevices. Thus, this study suggests an effective way to form a lateral p-n junction by the h-BN hard masking technique and to improve the photoresponse of MoS2 by the chemical doping process.

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