RTN distribution comparison for bulk, FDSOI and FinFETs devices
Louis GerrerDevice Modelling Group, Univ. of Glasgow, G12 8LT, UKSalvatore AmorosoDevice Modelling Group, Univ. of Glasgow, G12 8LT, UKRazaidi HussinDevice Modelling Group, Univ. of Glasgow, G12 8LT, UKA. AsenovDevice Modelling Group, Univ. of Glasgow, G12 8LT, UK
2014en
ABI
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