Ushbu ishga iqtibos qilgan ishlar

2 ta ish

Ish: Read/write mechanisms and data storage system using atomic force microscopy and MEMS technology

1. Characterising lateral capacitance of MNOSFET with localised trapped charge in nitride layer

   A. É. Atamuratov, Zamira Atamuratova, А. Yusupov +1

   MaqolaSemiconductor materials and devicesResults in Physics20183 iqtibos

   ABIABI:AkademIndex/openalex/2026.other.570280

2. Anomalous Behavior of Lateral C–V Characteristic of an MNOS Transistor with an Embedded Local Charge in the Nitride Layer

   Zamira Atamuratova, А. Yusupov, B. O. Khalikberdiev +1

   MaqolaSemiconductor materials and devicesTechnical Physics20193 iqtibos

   ABIABI:AkademIndex/openalex/2026.other.570281