Ushbu ishga iqtibos qilgan ishlar

2 ta ish

Ish: Surface investigation of solids by the statical method of secondary ion mass spectroscopy (SIMS)

1. Temperature Dependences of the Sputtering of Negative Silicon Cluster Ions

   Б.Г. Атабаев, R. Dzabbarganov, F. R. Yuzikaeva +3

   MaqolaIon-surface interactions and analysisJournal of Surface Investigation X-ray Synchrotron and Neutron Techniques20230 iqtibos

   ABIABI:AkademIndex/openalex/2023.article.004220

2. Emission of Negative Copper Cluster Ions as a Function of Temperature and Bombarding Ion Energy

   R. Djabbarganov, B. G. Atabaev, A. S. Khalmatov

   MaqolaIon-surface interactions and analysisJournal of Surface Investigation X-ray Synchrotron and Neutron Techniques20250 iqtibos

   ABIABI:AkademIndex/openalex/2025.article.019144