D.K. Kabilov

9 works

Institute of Electronics, Academy of Sciences of the Republic of Uzbekistan, 33 F Hodzhaev st., Tashkent 700143, Uzbekistan

Photoelectric properties of higher manganese silicide (HMS)-SilangleMnrangle-M structures
T. S. Kamilov, V. P. Chirva, D.K. Kabilov
ArticleSemiconductor materials and interfacesSemiconductor Science and Technology199911 citations
ABI
About the mechanism of formation and growth of the higher manganese silicide films on silicon
T. S. Kamilov, D.K. Kabilov, I.S. Samiev +6
ArticleSemiconductor materials and interfaces20053 citations
ABI
Role of the silicon dioxide in formation of higher manganese silicide films
T. S. Kamilov, A.A. Uzokov, D.K. Kabilov +3
ArticleAdvanced Thermoelectric Materials and Devices20042 citations
ABI
Formation of higher manganese silicide films on silicon
T. S. Kamilov, D.K. Kabilov, I.S. Samiev +3
ArticleSemiconductor materials and interfacesTechnical Physics20052 citations
ABI
Development of thermoelectric detectors on the basis of higher manganese silicide (HMS) films
T. S. Kamilov, A.A. Uzokov, D.K. Kabilov +5
ArticleAdvanced Thermoelectric Materials and Devices20041 citations
ABI
The thermoelectric radiation detector based on the multielement structures of the higher manganese silicide films
T. S. Kamilov, D.K. Kabilov, I.S. Samiev +2
ArticleSemiconductor materials and interfaces20051 citations
ABI
Growth technique and structural properties of the higher manganese silicide films
T. S. Kamilov, D.K. Kabilov, I.S. Samiev +3
ArticleSemiconductor materials and interfaces20051 citations
ABI
Investigation of the Magnesium Silicide -- Mg<sub>2</sub>Si Films
T. S. Kamilov, D.K. Kabilov, R.Kh. Kamilova +4
ArticleSemiconductor materials and interfaces20060 citations
ABI
About the Interface Between the Higher Manganese Silicide Film and Si (111)
T. S. Kamilov, D.K. Kabilov, S.Kh. Babadjanov +5
ArticleSemiconductor materials and interfaces20060 citations
ABI