Article

Focusing of a Compensated Nonuniform Electron Beam

S. V. AdamenkoNational scientific centre of Kharkov physicotechnical instituteВ. В. ДолгополовNational scientific centre of Kharkov physicotechnical instituteYu. V. KirichenkoThe National Scientific Center, "Kharkiv Institute of Physics and Technology", 1 Akademichna St., 61108 Kharkiv, UkraineV.A. StratienkoNational scientific centre of Kharkov physicotechnical institute

Telecommunications and Radio Engineeringjournal1999en

ABI

Abstract

This shows the manner in which the influence nonuniformity of a compensated electron beam on its focusing close to a target is investigated. This shows the manner in which the increase of the beam uniformity improves its focusing.

Topics

Advanced Electron Microscopy Techniques and Applications Electron and X-Ray Spectroscopy Techniques Advanced X-ray Imaging Techniques

Identifiers

DOI: 10.1615/telecomradeng.v53.i2.150

Citations and references

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