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Work: Effect of anodic etching of heavily doped silicon on the location of the plasma minimum

  1. Determination of Optical Constants and Carrier Effective Mass of Semiconductors

    W. G. Spitzer, Heng Fan

    Article19572 citations
    ABI
  2. Resistivity of Bulk Silicon and of Diffused Layers in Silicon

    J.C. Irvin

    Article19622 citations
    ABI
  3. Untitled

    Other1 citations
    ABI
  4. Untitled

    Other1 citations
    ABI
  5. Untitled

    Other1 citations
    ABI
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    Other1 citations
    ABI