Capacitance transient spectroscopy of radiation defects on Si-SiO 2 interface of silicon mis-structures
Kh.Sh. DalievSharifa B. UtamuradovaA.J. AkbarovTashkentskij Gosudarstvennyj Univ., Tashkent (Uzbekistan)
1999en
ABI
Abstract
No abstract available.
Topics
Citations and references
Cited by 00 references