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Kh.Sh. Daliev

1 works

  1. Capacitance transient spectroscopy of radiation defects on Si-SiO 2 interface of silicon mis-structures

    Kh.Sh. Daliev, Sharifa B. Utamuradova, A.J. Akbarov

    ArticleSilicon and Solar Cell Technologies19990 citations
    ABI