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Effect of the band-tail states on the exciton peaks in GaN epilayers grown on sapphire substrates

Tae Won KangDepartment of Physics, Dongguk University, 3-26, Pildong, Chungku, Seoul 100-715, KoreaSh. U. YuldashevDepartment of Physics, Dongguk University, 3-26, Pildong, Chungku, Seoul 100-715, KoreaIgor L. BolotinDepartment of Physics, Dongguk University, 3-26, Pildong, Chungku, Seoul 100-715, KoreaS. H. ParkDepartment of Physics, Dongguk University, 3-26, Pildong, Chungku, Seoul 100-715, KoreaD. Y. KimDepartment of Physics, Dongguk University, 3-26, Pildong, Chungku, Seoul 100-715, KoreaSeungHwan WonDepartment of Electronic Engineering, Kyunghee University, Yong-in, KoreaK.S. JungDepartment of Electronic Engineering, Kyunghee University, Yong-in, KoreaT. W. KimDepartment of Physics, Kwangwoon University, 447-1 Wolgye-dong, Nowon-ku, Seoul 139-701, Korea
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Abstract

Photoluminescence (PL) measurements have been carried out to investigate the effects of the band-tail states on the exciton lines in unintentionally doped and Mg-doped GaN epilayers grown on sapphire substrates by using plasma-assisted molecular beam epitaxy. The results of the PL spectra for the Mg-doped epilayers show that the peak positions of the bound exciton lines shift to higher energy with increasing temperature within the low-temperature region. The radiative recombinations of the carriers are related to the band-tail states, and the temperature-dependent blueshifts are analyzed by using a Gaussian distribution of charged impurities. The calculated thermal activation energies of the band-edge emission lines show that those lines in Mg-doped GaN epilayers are related to ionized donor bound exciton recombinations. These results indicate that the positions and the intensities of the exciton peaks observed in Mg-doped GaN films are significantly affected by the concentration of the magnesium dopant.

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