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Reliability of 4H-SiC p-n Diodes on LPE Grown Layers

G. SarovBulgarian Academy of SciencesRoumen KakanakovBulgarian Academy of SciencesT. CholakovaBulgarian Academy of SciencesLiliana KassamakovaBulgarian Academy of SciencesN. HristevaBulgarian Academy of SciencesG. LepoevaBulgarian Academy of SciencesPadha Nikolava PhilipovaBulgarian Academy of SciencesN.I. KuznetsovIoffe Physicotechnical Institute RASKonstantinos ZekentesFoundation for Research and Technology-Hellas(FORTH)
Materials science forumbook series2003en
ABI

Abstract

No abstract available.

Topics

Silicon Carbide Semiconductor TechnologiesElectromagnetic Compatibility and Noise SuppressionMultilevel Inverters and Converters

Identifiers

DOI
10.4028/www.scientific.net/msf.433-436.929

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Cited by 05 references
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