Article

<title>Off-axis Z-scan technique for investigation of nonlinear refraction: aperture size effect</title>

Aleksandr RyasnyanskiySamarkand State Univ. (Uzbekistan)

Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIEjournal2006en

ABI

Abstract

The results of theoretical investigations of the off-axis Z-scan technique for the measurement of nonlinear refraction in materials are presented. The normalized transmittances are calculated for different aperture radii and positions. The dependence of both the normalized transmittance amplitude (T<sub>pv</sub>) and the distance between maximum and minimum (Z<sub>pv</sub>) on the aperture radius is analyzed.

Topics

Nonlinear Optical Materials Studies Nonlinear Optical Materials Research Force Microscopy Techniques and Applications

Identifiers

DOI: 10.1117/12.677965

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&lt;title&gt;Off-axis Z-scan technique for investigation of nonlinear refraction: aperture size effect&lt;/title&gt;

Abstract

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Citations and references

<title>Off-axis Z-scan technique for investigation of nonlinear refraction: aperture size effect</title>