INFLUENCE OF REFLECTION OF PHOTOELECTRONS FROM THE SURFACE PHOTO-EMF IN THIN SEMICONDUCTOR FILMS AND COMPARE IT WITH THE BULK PHOTO-EMF
G. GulyamsNamangan Engineering-Pedagogical Institute 12 Dustlik ave., Namangan, 160103, Republic of UzbekistanM. G. DadamirzayevNamangan Engineering-Pedagogical Institute 12 Dustlik ave., Namangan, 160103, Republic of UzbekistanN. Yu. SharibaevNamangan Engineering-Technological Institute 7 Kasanay str., Namangan, 160115, Republic of Uzbekistan
ABI
Abstract
The influence of the reflection of photoelectrons from the surface photo-EMF in thin semiconductor films and compare it with the bulk photo-EMF. It is shown that the reflected photovoltage can prevail over the bulk of the electromotive force only in samples with a large mean free path with a strong absorption of light. In thin films reflected the photo-EMF, apparently observed with other types of photo-EMF and the interpretation of the experimental results can be interpreted as the volume electromotive force.
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