Works citing this work

5 works

Work: Study of the Influence of Implanted Atoms on the Coefficients of the Sputtering of Silicon and Silicon with a Thin Oxide Film

1. Study of the Composition of Uncontrolled Impurities and the Profiles of Their Distribution at the Ni–CdS Interface

   A. A. Abduvayitov, Kh. Kh. Boltaev, G. A. Rozikov

   ArticleChalcogenide Semiconductor Thin FilmsJournal of Surface Investigation X-ray Synchrotron and Neutron Techniques20220 citations

   ABIABI:AkademIndex/openalex/2022.article.008003

2. Peculiarities of Photoelectron Spectra of Ge Implanted with Na-=SUP=-+-=/SUP=- Ions

   S. T. Abraeva, Д. А. Ташмухамедова, M. B. Yusupjanova +1

   ArticleIon-surface interactions and analysisПисьма в журнал технической физики20230 citations

   ABIABI:AkademIndex/openalex/2023.article.006069

3. Impact of bombardment by Ar⁺, Na⁺ and <i>O</i>₂⁺ ions on spectra of elastically scattered electrons of single-crystal Ge

   S. T. Abraeva, Д. А. Ташмухамедова, Soadat Gulyamova +2

   ArticleSilicon Nanostructures and PhotoluminescenceE3S Web of Conferences20230 citations

   ABIABI:AkademIndex/openalex/2023.article.009656

4. Epitaxial Growth of Ge Nanofilms on the Surface of SrF2

   S. T. Abraeva, Д. А. Ташмухамедова, Б. Е. Умирзаков

   ArticleSemiconductor materials and devicesJournal of Surface Investigation X-ray Synchrotron and Neutron Techniques20230 citations

   ABIABI:AkademIndex/openalex/2023.article.013288

5. Effect of Electron Bombardment on the Composition and Structure of CaF2/Si(111) Films

   A. A. Abduvayitov, Д. А. Ташмухамедова, Б. Е. Умирзаков +1

   ArticleSemiconductor materials and devicesJournal of Surface Investigation X-ray Synchrotron and Neutron Techniques20240 citations

   ABIABI:AkademIndex/openalex/2024.article.003446