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Works cited by this work

35 works

Work: Sputtering of GaAs target under Bi+ cluster ions bombardment

  1. Surface ionization of organic compounds and its applications

    У. Х. Расулев, É. Ya. Zandberg

    Article198831 citations
    ABI

  2. Thermal spikes observed during the tantalum sputtering by gold cluster ions

    С. Н. Морозов, У. Х. Расулев

    ArticleIon-surface interactions and analysisTechnical Physics Letters200312 citations
    ABI

  3. The fragmentation of sputtered cluster ions and their contribution to secondary ion mass-spectra

    Н. Х. Джемилев, У. Х. Расулев, С. В. Верхотуров

    Article198712 citations
    ABI

  4. Comparative study of polyatomic secondary ion emission from silicon with <mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" altimg="si11.gif" overflow="scroll"><mml:mrow><mml:msubsup><mml:mrow><mml:mtext>Au</mml:mtext></mml:mrow><mml:mrow><mml:mi>m</mml:mi></mml:mrow><mml:mrow><mml:mo>-</mml:mo></mml:mrow></mml:msubsup></mml:mrow></mml:math>, <mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" altimg="si12.gif" overflow="scroll"><mml:mrow><mml:msubsup><mml:mrow><mml:mtext>Si</mml:mtext></mml:mrow><mml:mrow><mml:mi>m</mml:mi></mml:mrow><mml:mrow><mml:mo>-</mml:mo></mml:mrow></mml:msubsup></mml:mrow></mml:math> and <mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" altimg="si13.gif" overflow="scroll"><mml:mrow><mml:msubsup><mml:mrow><mml:mtext>C</mml:mtext></mml:mrow><mml:mrow><mml:mi>m</mml:mi></mml:mrow><mml:mrow><mml:mo>-</mml:mo></mml:mrow></mml:msubsup></mml:mrow></mml:math> projectiles

    С. Н. Морозов, У. Х. Расулев

    ArticleIon-surface interactions and analysisNuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms200611 citations
    ABI

  5. The formation of clusters during ion induced sputtering of metals

    A. Wucher, Michael Wahl

    Article199611 citations
    ABI

  6. Non-additive effects in secondary-ion emission from V, Nb and Ta under gold-cluster bombardment

    С. Н. Морозов, У. Х. Расулев

    ArticleIon-surface interactions and analysisApplied Surface Science200411 citations
    ABI

  7. High non-additive sputtering of silicon as large positive cluster ions under polyatomic ion bombardment

    S.F. Belykh, У. Х. Расулев, A.V. Samartsev +2

    ArticleIon-surface interactions and analysisVacuum20009 citations
    ABI

  8. Impact of slow gold clusters on various solids: nonlinear effects in secondary ion emission

    M. Benguerba, Alain Brunelle, S. Della‐Negra +7

    Article19915 citations
    ABI

  9. The emission of neutral clusters in sputtering

    Hubert Gnaser, Wolfgang Höfer

    Article19895 citations
    ABI

  10. Sputtering of indium using<mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" display="inline"><mml:msub><mml:mi mathvariant="normal">Au</mml:mi><mml:mi>m</mml:mi></mml:msub></mml:math>projectiles: Transition from linear cascade to spike regime

    A.V. Samartsev, A. Duvenbeck, A. Wucher

    Article20054 citations
    ABI

  11. Nonadditive sputtering of silicon by keV energy molecular projectiles of heavy and light elements

    S.F. Belykh, A.P. Kovarsky, Vladimir Palitsin +2

    Article20013 citations
    ABI

  12. Model for the emission of quasi-thermal atoms during sputtering of metals in the nonlinear collision cascade regime

    S.F. Belykh, А. Б. Толстогузов, A. A. Lozovan +2

    Article20143 citations
    ABI

  13. Molecular secondary ion formation under cluster bombardment: A fundamental review

    A. Wucher

    Review article20063 citations
    ABI

  14. On the Sputtering of Copper Phthalocyanine Molecules on a GaAs Substrate under Bombardment with Multiply Charged Ions

    Sh.Dj. Akhunov, У. Х. Расулев, Dilshadbek T. Usmanov

    ArticleIon-surface interactions and analysisJournal of Surface Investigation X-ray Synchrotron and Neutron Techniques20213 citations
    ABI

  15. Formation of High-Mass Cluster Ions from Compound Semiconductors Using Time-of-Flight Secondary Ion Mass Spectrometry with Cluster Primary Ions

    Robyn E. Goacher, Hong Luo, Joseph A. Gardella

    Article20082 citations
    ABI

  16. Metal-assisted SIMS and cluster ion bombardment for ion yield enhancement

    Andreas Heile, D. Lipinsky, Nimer Wehbe +8

    Article20082 citations
    ABI

  17. Cluster ion sputtering: molecular ion yield relationships for different cluster primary ions in static SIMS of organic materials

    M. P. Seah

    Article20072 citations
    ABI

  18. Recent Progress in Cluster Beam Technique

    Jiro Matsuo, Makiko Fujii, Toshio Seki +1

    Article20162 citations
    ABI

  19. Secondary ion emission from a GaAs single crystal upon bombardment with Bi+ m cluster ions

    С. Н. Морозов, У. Х. Расулев

    ArticleIon-surface interactions and analysisBulletin of the Russian Academy of Sciences Physics20162 citations
    ABI

  20. Reducing the Matrix Effect in Organic Cluster SIMS Using Dynamic Reactive Ionization

    Hua Tian, A. Wucher, Nicholas Winograd

    Article20162 citations
    ABI

  21. Nonlinear effects in low-energy ion sputtering of solids

    Yuriy Kudriavtsev, R. Asomoza, A. G. Hernández +3

    Article20202 citations
    ABI

  22. Sputtering of silicon by atomic and cluster bismuth ions: An influence of projectile nuclearity and specific kinetic energy on the sputter yield

    A. Tolstogouzov, Paul Mazarov, A.E. Ieshkin +4

    Article20212 citations
    ABI

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    Other1 citations
    ABI

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    Other1 citations
    ABI

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    Other1 citations
    ABI