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Work: X-Ray Diffraction and Raman Spectroscopy Analyses of GaSb-Enriched Si Surface Formed by Applying Diffusion Doping Technique

  1. Raman spectra of Si-implanted GaSb

    Yan Su, Kwang-Jow Gan, J. S. Hwang +1

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  2. III–V compound materials and lasers on silicon

    Wenyu Yang, Yajie Li, Fangyuan Meng +6

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