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Works cited by this work

10 works

Work: Radiation-Stimulated Transformation of Cxygen Atoms Between Impurity Phase States of A Growing Silicon Single Crystal

  1. General Relationship for the Thermal Oxidation of Silicon

    B. E. Deal, Andrew S. Grove

    Article19653 citations
    ABI

  2. Method to Measure the Precipitated and Total Oxygen Concentration in Silicon

    L. Jastrzȩbski, P. J. Zanzucchi, D. Thébault +1

    Article19823 citations
    ABI

  3. Oxygen Segregation and Microscopic Inhomogeneity in Czochralski Silicon

    Wen Lin, Michael Stavola

    Article19853 citations
    ABI

  4. Test Method for Interstitial Atomic Oxygen Content of Silicon by Infrared Absorption with Short Baseline

    F01 Committee

    Other20003 citations
    ABI

  5. Czochralski growth of silicon

    W. Zulehner

    Article19832 citations
    ABI

  6. Oxygen precipitation and microdefects in Czochralski-grown silicon crystals

    Kiyoshi Yasutake, M. Umeno, H. Kawabe

    Article19842 citations
    ABI

  7. Stress in The SiO2/Si Structures Formed by Thermal Oxidation

    A. Szekeres

    Chapter19982 citations
    ABI

  8. Thermally Stimulated Transformation of Oxygen Atoms Between Phase States in a Silicon Single Crystal

    M. U. Kalanov, I. I. Sadikov, A. V. Khugaev +4

    ArticleSilicon Nanostructures and PhotoluminescenceSilicon20241 citations
    ABI

  9. Untitled

    Other1 citations
    ABI

  10. Untitled

    Other1 citations
    ABI