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8 works

Work: Modification of the Surface Properties of Free Si–Cu Films by Implantation of Active Metal Ions

  1. Comparison of electron irradiation on the formation of surface defects in situ and post thin-film LiF/Si(111) deposition

    U. B. Sharopov, Kulwinder Kaur, М. К. Курбанов +4

    ArticleSemiconductor materials and devicesThin Solid Films202113 citations
    ABI

  2. Controlling the Low-temperature Ionic Purification of a Silicon Surface by Electron Spectroscopy

    U. B. Sharopov, Kulwinder Kaur, М. К. Курбанов +3

    ArticleIon-surface interactions and analysisSilicon202111 citations
    ABI

  3. Electrophysical and thermoelectric properties and crystal structure of the formed Mn4Si7 thin vacuum coatings

    Б.Д. Игамов, Gunel Imanova, Vera Loboda +3

    ArticleChalcogenide Semiconductor Thin FilmsOptical Materials X20244 citations
    ABI

  4. Electronic Structure and Properties of Nanoscale Structures Created on the Surface of a Free Si/Cu Film System

    З. А. Исаханов, R. M. Yorkulov, Б. Е. Умирзаков +2

    ArticleIon-surface interactions and analysisJournal of Surface Investigation X-ray Synchrotron and Neutron Techniques20212 citations
    ABI

  5. Distribution of Molybdenum Atoms over Depth of the Surface Layer of a Niobium Single Crystal Produced by Ion Bombardment

    Y. S. Ergashov, S. B. Donaev

    ArticleIon-surface interactions and analysisJournal of Nano- and Electronic Physics20221 citations
    ABI

  6. Controlling the Low-Temperature Ionic Purification of a Silicon Surface by Electron Spectroscopy

    U. B. Sharopov, Kulwinder Kaur, М. К. Курбанов +3

    PreprintSemiconductor materials and devicesResearch Square20211 citations
    ABI

  7. CHANGES IN THE SURFACE OF CdS BOMBARDED BY O+ IONS

    Sodikjanov Jakhongirbek Shukhratbek Ugli

    ArticleQuantum Dots Synthesis And PropertiesThe American Journal of Engineering And Technology20230 citations
    ABI

  8. Temperature dependence changes in the physical and chemical properties of ZnO detected by powder diffractometry

    U.Kh. Kholikov, Ш. Т. Хожиев, И.О. Косимов +7

    ArticleZnO doping and propertiesOptics Communications20250 citations
    ABI