Works citing this work

5 works

Work: EVOLUTION OF CONDUCTION MECHANISM IN THICK FILM RESISTORS.

1. Pseudogap, Nanocrystals and Electrical Conductivity of Doped Silicate Glass

   G. Abdurakhmanov, V. I. Shimanski, Б. Л. Оксенгендлер +2

   ArticleElectrical and Thermal Properties of MaterialsTechnical Physics20213 citations

   ABIABI:AkademIndex/openalex/2021.article.000842

2. Impact of Ruthenium Diffusion on the Electrical Properties of Thick Film Resistors

   Avazbek T. Dekhkonov, G. Abdurakhmanov, Mukhriddin E. Tursunov +5

   ArticleElectrical and Thermal Properties of MaterialsEast European Journal of Physics20251 citations

   ABIABI:AkademIndex/openalex/2025.article.002402

3. Effect of Ba+-Ion Implantation on the Composition and Electronic Structure of Silicate Glasses

   Д. А. Ташмухамедова, A. N. Urokov, G. Abdurakhmanov +1

   ArticleGlass properties and applicationsJournal of Surface Investigation X-ray Synchrotron and Neutron Techniques20230 citations

   ABIABI:AkademIndex/openalex/2023.article.007101

4. Influence of Implantation of Ions Ba<sup>+</sup> on the Composition and Electronic Structure of Silicate Glasses

   Д. А. Ташмухамедова, A. N. Urokov, G. Abdurakhmanov +1

   ArticleGlass properties and applicationsПоверхность Рентгеновские синхротронные и нейтронные исследования20230 citations

   ABIABI:AkademIndex/openalex/2023.article.013585

5. Intrinsic Electrical Conductivity of Silicate Glass Doped with Ruthenium Dioxide: Experimental Evidence

   G. Abdurakhmanov, Avazbek T. Dekhkonov, Mukhriddin E. Tursunov

   ArticleElectrical and Thermal Properties of Materialsphysica status solidi (b)20250 citations

   ABIABI:AkademIndex/openalex/2025.article.002451