Works citing this work

2 works

Work: Surface Mass Spectrometry at the Submicrometer Scale

1. Secondary ion emission under the bombardment of Si by multiply charged Si q+ ions

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   ABIABI:AkademIndex/openalex/2012.article.000100

2. Cluster projectile ions used for the SIMS analysis of silicon

   Sh.Dj. Akhunov, С. Н. Морозов

   ArticleIon-surface interactions and analysisJournal of Surface Investigation X-ray Synchrotron and Neutron Techniques20131 citations

   ABIABI:AkademIndex/openalex/2013.article.000207