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Works citing this work
1 works
Electron microscopy characterization of higher manganese silicide film structure on silicon
Andrey Orekhov
,
T. S. Kamilov
,
Anton S. Orekhov
+3
Article
Semiconductor materials and interfaces
Nanotechnologies in Russia
2016
7 citations
ABI
ABI:AkademIndex/openalex/2026.other.079735