Works citing this work

2 works

Work: Read/write mechanisms and data storage system using atomic force microscopy and MEMS technology

1. Characterising lateral capacitance of MNOSFET with localised trapped charge in nitride layer

   A. É. Atamuratov, Zamira Atamuratova, А. Yusupov +1

   ArticleSemiconductor materials and devicesResults in Physics20183 citations

   ABIABI:AkademIndex/openalex/2026.other.570280

2. Anomalous Behavior of Lateral C–V Characteristic of an MNOS Transistor with an Embedded Local Charge in the Nitride Layer

   Zamira Atamuratova, А. Yusupov, B. O. Khalikberdiev +1

   ArticleSemiconductor materials and devicesTechnical Physics20193 citations

   ABIABI:AkademIndex/openalex/2026.other.570281