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Works citing this work
1 works
Effect of thermal-field treatment and ionizing radiation on the energy spectrum of interfacial states at the Si-SiO2 interface of a MOS transistor
A. É. Atamuratov
,
С. З. Зайнабидинов
,
А. Yusupov
+2
Article
Semiconductor materials and devices
Technical Physics
1997
0 citations
ABI
ABI:AkademIndex/openalex/1997.article.000193