P. Prinetto

Работ: 1

Polytechnic University of Turin

1. Fault tolerant and BIST design of a FIFO cell

   Fulvio Corno, P. Prinetto, M. Sonza Reorda

   СтатьяVLSI and Analog Circuit TestingPORTO Publications Open Repository TOrino (Politecnico di Torino)1996Цитирований: 0

   ABIABI:AkademIndex/openalex/1996.article.000062