VLSI and Analog Circuit Testing

Работ: 21

The Complexity of Testing Cryptographic Devices on Input Faults
Alisher Ikramov, Gayrat Juraev
ГлаваVLSI and Analog Circuit TestingLecture notes in computer science2021Цитирований: 5
ABI
Methods of Determining Reference Signals for One and Multichannel Signatural Analyzer of Microprocessor Systems
Rustam Хusanovich Djuraev
СтатьяVLSI and Analog Circuit TestingCommunications2018Цитирований: 4
ABI
Development of simulation model of smart phase selector device
E. Khojiakbar, I.Kh. Kholiddinov, Asrorbek Eraliev +2
СтатьяVLSI and Analog Circuit TestingE3S Web of Conferences2023Цитирований: 4
ABI
Model and Methods for Detecting Undetected Errors Using a Signature Analyzer
Jo’shqin Baltayev, Sunnatillo Boltayev
ГлаваVLSI and Analog Circuit TestingLecture notes in networks and systems2022Цитирований: 2
ABI
Codebase release 5.3 for EDIpack
Lorenzo Crippa, Igor Krivenko, Samuele Giuli +10
СтатьяEmbedded Systems Design TechniquesSciPost Physics Codebases2025Цитирований: 1
ABI
Study of the Method of Compact Testing of Technical Means of Data Transmission Networks
Rustam Djurayev, Jo’shqin Baltayev, J.I. Badalov
СтатьяVLSI and Analog Circuit Testing2020 International Conference on Information Science and Communications Technologies (ICISCT)2020Цитирований: 1
ABI
Fault tolerant and BIST design of a FIFO cell
Fulvio Corno, P. Prinetto, M. Sonza Reorda
СтатьяVLSI and Analog Circuit TestingPORTO Publications Open Repository TOrino (Politecnico di Torino)1996Цитирований: 0
ABI
An integrated HW and SW fault injection environment for real-time systems
Alfredo Benso, Maurizio Rebaudengo, M. Sonza Reorda +1
СтатьяRadiation Effects in Electronics2002Цитирований: 0
ABI
Design Validation of Multithreaded Processors Using Threads Evolution
D. Ravotto, Ernesto Sánchez, M. Sonza Reorda +1
СтатьяEmbedded Systems Design TechniquesJournal of Integrated Circuits and Systems2010Цитирований: 0
ABI
A High Performance Digital Time Interval Spectrometer: An Embedded, FPGA-Based System With Reduced Dead Time Behaviour
Mohammad Arkani
СтатьяAdvancements in PLL and VCO TechnologiesMetrology and Measurement Systems2015Цитирований: 0
ABI
History, Structure And Types Of Microprocessors
Hakimov Zohid Abdullayevich
СтатьяEmbedded Systems Design TechniquesThe American Journal of Interdisciplinary Innovations and Research2020Цитирований: 0
ABI
test data for ParaQA
Barshana Banerjee
ДругоеVLSI and Analog Circuit TestingFigshare2020Цитирований: 0
ABI
test data for ParaQA
Barshana Banerjee
ДругоеVLSI and Analog Circuit TestingFigshare2020Цитирований: 0
ABI
test data for ParaQA
Barshana Banerjee
ДругоеVLSI and Analog Circuit TestingFigshare2020Цитирований: 0
ABI
test data for ParaQA
Barshana Banerjee
ДругоеVLSI and Analog Circuit TestingFigshare2020Цитирований: 0
ABI
A Novel Compaction Approach for SBST Test Programs
Juan-David Guerrero-Balaguera, Josie E. Rodriguez Condia, M. Sonza Reorda
ПрепринтVLSI and Analog Circuit Testing2021Цитирований: 0
ABI
Performance Analysis Of SRAM and Dram in Low Power Application
S. Yuvaraj, D. Padmanaban, G. PraveenKumar +3
СтатьяLow-power high-performance VLSI designE3S Web of Conferences2023Цитирований: 0
ABI
A Versatile Strategy for Comprehensive Data Collection and Retention in Embedded SoC Memories
Paolo Bernardi, Giorgio Insinga, M. Battilana +7
СтатьяVLSI and Analog Circuit TestingACM Transactions on Embedded Computing Systems2025Цитирований: 0
ABI
Analysis of Dynamic Domino Logic Gate Performance Using Body Bias Techniques in Sub-Micron VLSI
Ravi Kumar M, K. M. Pimple, Prabhakaran K +3
СтатьяLow-power high-performance VLSI design2025Цитирований: 0
ABI
AI-Driven Fault Detection and Predictive Maintenance in Green Electronic Systems
Charul Jain, Bhupinder Kaur, Sumit Kumar +1
СтатьяMachine Fault Diagnosis Techniques2026Цитирований: 0
ABI
VLM-Assisted Self-Healing GUI Testing with Hybrid CLIP SigLIP Matching
Manzura Kosimova, Dilafruz Sayfullayeva, Bexzod Dehqonov +2
ГлаваVLSI and Analog Circuit TestingLecture notes in networks and systems2026Цитирований: 0
ABI