VLSI and Analog Circuit Testing

21 та иш

The Complexity of Testing Cryptographic Devices on Input Faults
Alisher Ikramov, Gayrat Juraev
БобVLSI and Analog Circuit TestingLecture notes in computer science20215 иқтибос
ABI
Methods of Determining Reference Signals for One and Multichannel Signatural Analyzer of Microprocessor Systems
Rustam Хusanovich Djuraev
МақолаVLSI and Analog Circuit TestingCommunications20184 иқтибос
ABI
Development of simulation model of smart phase selector device
E. Khojiakbar, I.Kh. Kholiddinov, Asrorbek Eraliev +2
МақолаVLSI and Analog Circuit TestingE3S Web of Conferences20234 иқтибос
ABI
Model and Methods for Detecting Undetected Errors Using a Signature Analyzer
Jo’shqin Baltayev, Sunnatillo Boltayev
БобVLSI and Analog Circuit TestingLecture notes in networks and systems20222 иқтибос
ABI
Codebase release 5.3 for EDIpack
Lorenzo Crippa, Igor Krivenko, Samuele Giuli +10
МақолаEmbedded Systems Design TechniquesSciPost Physics Codebases20251 иқтибос
ABI
Study of the Method of Compact Testing of Technical Means of Data Transmission Networks
Rustam Djurayev, Jo’shqin Baltayev, J.I. Badalov
МақолаVLSI and Analog Circuit Testing2020 International Conference on Information Science and Communications Technologies (ICISCT)20201 иқтибос
ABI
Fault tolerant and BIST design of a FIFO cell
Fulvio Corno, P. Prinetto, M. Sonza Reorda
МақолаVLSI and Analog Circuit TestingPORTO Publications Open Repository TOrino (Politecnico di Torino)19960 иқтибос
ABI
An integrated HW and SW fault injection environment for real-time systems
Alfredo Benso, Maurizio Rebaudengo, M. Sonza Reorda +1
МақолаRadiation Effects in Electronics20020 иқтибос
ABI
Design Validation of Multithreaded Processors Using Threads Evolution
D. Ravotto, Ernesto Sánchez, M. Sonza Reorda +1
МақолаEmbedded Systems Design TechniquesJournal of Integrated Circuits and Systems20100 иқтибос
ABI
A High Performance Digital Time Interval Spectrometer: An Embedded, FPGA-Based System With Reduced Dead Time Behaviour
Mohammad Arkani
МақолаAdvancements in PLL and VCO TechnologiesMetrology and Measurement Systems20150 иқтибос
ABI
History, Structure And Types Of Microprocessors
Hakimov Zohid Abdullayevich
МақолаEmbedded Systems Design TechniquesThe American Journal of Interdisciplinary Innovations and Research20200 иқтибос
ABI
test data for ParaQA
Barshana Banerjee
БошқаVLSI and Analog Circuit TestingFigshare20200 иқтибос
ABI
test data for ParaQA
Barshana Banerjee
БошқаVLSI and Analog Circuit TestingFigshare20200 иқтибос
ABI
test data for ParaQA
Barshana Banerjee
БошқаVLSI and Analog Circuit TestingFigshare20200 иқтибос
ABI
test data for ParaQA
Barshana Banerjee
БошқаVLSI and Analog Circuit TestingFigshare20200 иқтибос
ABI
A Novel Compaction Approach for SBST Test Programs
Juan-David Guerrero-Balaguera, Josie E. Rodriguez Condia, M. Sonza Reorda
ПрепринтVLSI and Analog Circuit Testing20210 иқтибос
ABI
Performance Analysis Of SRAM and Dram in Low Power Application
S. Yuvaraj, D. Padmanaban, G. PraveenKumar +3
МақолаLow-power high-performance VLSI designE3S Web of Conferences20230 иқтибос
ABI
A Versatile Strategy for Comprehensive Data Collection and Retention in Embedded SoC Memories
Paolo Bernardi, Giorgio Insinga, M. Battilana +7
МақолаVLSI and Analog Circuit TestingACM Transactions on Embedded Computing Systems20250 иқтибос
ABI
Analysis of Dynamic Domino Logic Gate Performance Using Body Bias Techniques in Sub-Micron VLSI
Ravi Kumar M, K. M. Pimple, Prabhakaran K +3
МақолаLow-power high-performance VLSI design20250 иқтибос
ABI
AI-Driven Fault Detection and Predictive Maintenance in Green Electronic Systems
Charul Jain, Bhupinder Kaur, Sumit Kumar +1
МақолаMachine Fault Diagnosis Techniques20260 иқтибос
ABI
VLM-Assisted Self-Healing GUI Testing with Hybrid CLIP SigLIP Matching
Manzura Kosimova, Dilafruz Sayfullayeva, Bexzod Dehqonov +2
БобVLSI and Analog Circuit TestingLecture notes in networks and systems20260 иқтибос
ABI