P. Prinetto

1 та иш

Polytechnic University of Turin

1. Fault tolerant and BIST design of a FIFO cell

   Fulvio Corno, P. Prinetto, M. Sonza Reorda

   МақолаVLSI and Analog Circuit TestingPORTO Publications Open Repository TOrino (Politecnico di Torino)19960 иқтибос

   ABIABI:AkademIndex/openalex/1996.article.000062