Работы, цитирующие эту работу

Работ: 1

Работа: Cluster projectile ions used for the SIMS analysis of silicon

1. On the Sputtering of Copper Phthalocyanine Molecules on a GaAs Substrate under Bombardment with Multiply Charged Ions

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   ABIABI:AkademIndex/openalex/2026.other.415083