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Работа: Effect of Ion Refocusing and Focusing at the Ne and Ar Small Angle Ion Bombardment on the Surface III-V Compound Semiconductors
The ion dechanneling mechanism at grazing scattering on the surface atomic steps
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СтатьяAdvanced Chemical Physics Studies2000 International Conference on Ion Implantation Technology Proceedings. Ion Implantation Technology - 2000 (Cat. No.00EX432)2002Цитирований: 1ABIStudy of Ion Scattering Process by the Method of Binary Collision Approximation
Kutliev Uchkun Otoboevich, Karimov Muxtor Karimberganovich, Narimonov Nurbek Davronbekovich
СтатьяIon-surface interactions and analysisInternational Journal of Trend in Scientific Research and Development2017Цитирований: 1ABI