Работы, на которые ссылается эта работа

Работ: 7

Работа: EFFECT OF TEMPERATURE TREATMENT ON THE ENERGY SPECTRUM OF DEFECTS IN SILICON DOPED WITH MOLYBDENUM

1. Deep-level transient spectroscopy: A new method to characterize traps in semiconductors

   D. V. Lang

   Статья1974Цитирований: 9

   ABIABI:AkademIndex/openalex/2026.other.424573

2. Transition metals in silicon

   Eicke R. Weber

   Статья1983Цитирований: 4

   ABIABI:AkademIndex/openalex/2026.other.225138

3. Capacitance Transient Spectroscopy

   G. L. Miller, D. V. Lang, Lionel C. Kimerling

   Статья1977Цитирований: 3

   ABIABI:AkademIndex/openalex/2026.other.682681

4. Electrical observation of the Au-Fe complex in silicon

   S. D. Brotherton, Peter D. Bradley, A. Gill +1

   Статья1984Цитирований: 2

   ABIABI:AkademIndex/openalex/2026.other.682680

5. Deep Level Transient Spectroscopy of Silicon, Doped by Zirconium

   Shakhrukh Kh. Daliev

   СтатьяIon-surface interactions and analysisInternational Journal for Research in Applied Science and Engineering Technology2018Цитирований: 1

   ABIABI:AkademIndex/openalex/2018.article.000622

6. Energy Spectrum of Defective Centers in Silicon Doped with Molybdenum

   Shakhrukh Kh. Daliev, Shoira Usmanova, Anifa Paluanova +21

   СтатьяSemiconductor materials and interfacesInternational Journal of Emerging Trends in Engineering Research2020Цитирований: 1

   ABIABI:AkademIndex/openalex/2020.article.002161

7. Без названия

   ДругоеЦитирований: 1

   ABIABI:AkademIndex/openalex/2026.other.682679