Работы, цитирующие эту работу

Работ: 2

Работа: Depth profiles of metal ions implanted in dielectrics at low energies

1. Saturated absorption and nonlinear refraction of silicate glasses doped with silver nanoparticles at 532 nm

   R. A. Ganeev, A.I. Ryasnyansky, А. Л. Степанов +1

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   ABIABI:AkademIndex/openalex/2004.article.000016

2. Effect of Co+-ion implantation on the composition and properties of free Si–Cu nanofilm structures

   З. А. Исаханов, Tulkin Kodirov, A. S. Halmatov +3

   СтатьяMetal and Thin Film MechanicsJournal of Surface Investigation X-ray Synchrotron and Neutron Techniques2017Цитирований: 3

   ABIABI:AkademIndex/openalex/2026.other.495101