Работы, цитирующие эту работу

Работ: 6

Работа: The solid-phase ion-plasma method and thermoelectric properties of thin CrSi2 films

1. Study of the physical nature of Mn4Si7 crystals formed by the diffusion method using an X-ray diffraction

   Б.Д. Игамов, A.I. Kamardin, D.Kh. Nabiev +5

   СтатьяX-ray Diffraction in CrystallographyJournal of Crystal Growth2024Цитирований: 8

   ABIABI:AkademIndex/openalex/2024.article.000891

2. Preparation of Calcium Titanate Perovskite Compound, Optical and Structural Properties

   Khujamkul Davranov, M.T. Normuradov, Muzaffar Davlatov +3

   СтатьяPerovskite Materials and ApplicationsEast European Journal of Physics2024Цитирований: 2

   ABIABI:AkademIndex/openalex/2024.article.000896

3. Influence of implantation of O2+ ions on the composition and electronic structure of the W(111) surface

   З. А. Исаханов, Б. Е. Умирзаков, D.Kh. Nabiev +5

   СтатьяTransition Metal Oxide NanomaterialsMicro and Nano Systems Letters2024Цитирований: 2

   ABIABI:AkademIndex/openalex/2024.article.001438

4. Raman and IR Spectrum Analysis of CrSi2 Thin Films Formed in Direct Current and Variable Frequency Modes of a Magnetron Sputtering Device

   K.T. Dovranov, Maksim Vinnichenko, V.V. Korablev +3

   СтатьяChalcogenide Semiconductor Thin Films2024Цитирований: 2

   ABIABI:AkademIndex/openalex/2024.article.003101

5. Study of The Process of Formation of Heterostructural Nanofilms MexSiy/Si and GaxMe1-xAs/GaAs by Ion Implantation

   Eshboboyev Sardor Nurbobo Ugli, Tashatov Allanazar Karshievich

   СтатьяIon-surface interactions and analysisJournal of Physical Science2025Цитирований: 0

   ABIABI:AkademIndex/openalex/2025.article.005323

6. Surface Morphology of Ni/GaAs Thin Films Produced by Ion-Plasma Method

   K.T. Dovranov, Shakhnoza Jurayeva, Muradulla Normuradov +6

   СтатьяSurface Roughness and Optical Measurements2025Цитирований: 0

   ABIABI:AkademIndex/openalex/2025.article.010648