Работы, цитирующие эту работу

Работ: 5

Работа: Sensitivity-enhanced reflection Z-scan by oblique incidence of a polarized beam

1. Single-shot reflection Z-scan for measurements of the nonlinear refraction of nontransparent materials

   R. A. Ganeev

   СтатьяNonlinear Optical Materials StudiesApplied Physics B2008Цитирований: 2

   ABIABI:AkademIndex/openalex/2008.article.000067

2. Reflection z‐scan measurements of opaque semiconductor thin films

   R. A. Ganeev, A.I. Ryasnyansky

   СтатьяNonlinear Optical Materials Studiesphysica status solidi (a)2004Цитирований: 2

   ABIABI:AkademIndex/openalex/2026.other.162154

3. Study of the nonlinear refractive index of chalcogenide films by the RZ-scan method

   A. I. Ryasnyanskiı̆

   СтатьяNonlinear Optical Materials StudiesOptics and Spectroscopy2005Цитирований: 2

   ABIABI:AkademIndex/openalex/2026.other.524838

4. Nonresonant Nonlinearity of Silver Nanoparticles

   A. I. Ryasnyanskiı̆

   СтатьяNonlinear Optical Materials StudiesJournal of Applied Spectroscopy2005Цитирований: 1

   ABIABI:AkademIndex/openalex/2026.other.360587

5. Ion synthesis and optical properties of gold nanoparticles in an Al2O3 matrix

   А. Л. Степанов, C. Marques, E. Alves +5

   СтатьяNonlinear Optical Materials StudiesTechnical Physics2006Цитирований: 0

   ABIABI:AkademIndex/openalex/2006.article.000165